Programme

09:00

Registration and refreshments

09:30

Executive Overview – evaluating the role of smart instrumentation

Mark D Cargill, Principal Electrical Engineer, MWH Global

10:10

Managing the increased level of data, and producing value from this information

• Availability of autonomous sensors

• Processing data from multiple autonomous sensors including assessing data integrity, quality and independence

• Multi agent techniques

Colin Utting, Senior Consultant Engineer, Technology Solutions, BAE Systems Submarine Solutions

10:50

Refreshment break

11:30

Is there any payback? Operational value versus capital expenditure

• Producing the correct specification for your requirements

• Cost analysis – illustrating the long term ROI for your investment

• Are there real benefits?

• Real examples of operational value either lost of gained

• What measures which needed to be implemented to gain maximum rewards

Graham Lowe, Senior ICA Engineer, United Utilities

12:10

Executive Panel Session

• What are the benefits to a process organisation?

• What are the challenges which face this technology?

12:40

Lunch

13:40

Assessment of smart instruments for use in safety applications in the civil nuclear sector

• What are the issues of using these instruments in safety applications in the nuclear sector?

• Covering HSE/NII expectations and the joint European nuclear regulators position on SMARTs

• What's been agreed in the UK Nuclear sector, exploring the two-legged approach and the "Emphasis" methodology

• Overview of Nuclear Industry's SMART Industry Working Group (NISIWG), outlining the assessment process

• Experiences of the suppliers' reactions to assessment

Robin Pearce, Leader C, E&I Safety Systems Design Capability & COE

Phil Litherland, Specialist Design Delivery Group, Sellafield Group

14:20

Refreshment break

15:00

Using HART to increase diagnostic coverage of SMART field devices

• How on-line monitoring of the HART information available in every HART field device can "unlock" valuable diagnostic information

• Examples of HART monitoring increases diagnostic coverage which results in lower undetected, dangerous failures

• Producing lower Probability of Failure on Demand and a higher Safe Failure Fraction in safety critical instrument loops

• An examination of the HART protocol and technology

• Discover how we can and monitor HART increase diagnostic coverage

John Emmett, Export Manager, Moore Industries-Europe, Inc.

15:40

Making instruments smart with 3G communications

• Cellular network evolution in the UK

• How to communicate with Instruments through the 3G network

• Understanding the pitfalls associated with cellular communications

• Application studies highlighting the benefits of cellular enabled Instruments

David Evans, Product Development Manager, Amplicon, Halam Rose, Technical Manager, Arkessa Ltd

16:20

Close of seminar